electron spectroscopy
英 [ɪˈlektrɒn spekˈtrɒskəpi]
美 [ɪˈlektrɑːn spekˈtrɑːskəpi]
电子能谱（学）
双语例句
- Electron spectroscopy for chemical analysis ( ESCA) low-energy electrostatic photoelectron spectrometer
电子能谱分析，化学分析用电子光谱 - Study on the Interface Between Metal Uranium and Aluminum Film by Auger Electron Spectroscopy
金属铀与铝薄膜界面的俄歇电子能谱研究 - Application Research of Electron Spectroscopy in Methanol Poisoning Catalyst Deactivation
电子能谱仪在甲醇催化剂中毒失活中的应用研究 - Electron spectroscopy for chemical analysis
化学分析用电子能谱术 - Higher-end research tools such as nuclear magnetic resonance, electron spectroscopy for chemical analysis, and mass spectroscopy can be used to characterise compounds in traditional medicines.
核磁共振、化学电子光谱分析法、质谱法等高端研究工具则可以用来分析传统药物的复合成分。 - Angular Distribution Auger Microscopy ── a New Development in Auger Electron Spectroscopy
角分布俄歇显微术&俄歇电子能谱的新进展 - Scanning Auger electron spectroscopy
扫描俄歇电子能谱学 - Study on Fluorine Induced Aluminum Bonding Pads Corrosions Using Auger Electron Spectroscopy
利用俄歇电子能谱仪研究Al焊垫表面的F腐蚀 - The initial oxidation of pure iron and implanted samples which were overlapped energy ion – implanted with C ions was studied by auger electron spectroscopy ( AES).
用俄歇电子能谱（AES）研究高真空室中纯铁和多能量叠加注碳纯铁表面与氧气吸附及初始氧化过程。 - Corrosion of anti-rust aluminum plate was analyzed by means of optical microscope, scanning electron microscope, energy dispersive spectroscopy, auger electron spectroscopy and X-ray photon spectroscopy.
采用光学金相、扫描电镜、能量色散谱、俄歇电子能谱和X光电子能谱等多种方法分析了防锈铝板表面发生大面积腐蚀的原因。 - Auger electron spectroscopy ( AES), scanning electron microscopy ( SEM) and atomic force microscopy ( AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱（AES）、扫描电镜（SEM）和原子力显微镜（AFM）对薄膜的组成成分和表面形貌进行了分析。 - The thickness of the oxide film was measured by Auger electron spectroscopy ( AES).
用Auger电子能谱（AES）分析氧化膜厚度。 - The phase composition, depth profile of N, and the wear mechanisms of the modified layers were investigated by means of X ray diffraction ( XRD), Auger electron spectroscopy ( AES), and scanning electron microscopy ( SEM).
用扫描电子显微镜（SEM）、俄歇电子能谱仪（AES）和X射线衍射仪（XRD）考察了改性层的相组成、N元素的深度分布及磨损机理。 - Electron energy loss spectroscopy ( EELS) of uranium and its oxidation processes were studied by Auger electron spectroscopy.
利用俄歇电子能谱仪获取了表面清洁的铀及其在氧化过程中的电子能量损失谱（EELS），研究这些电子能量损失谱线显示：清洁表面铀的等离子损失的实验值与理论值较为符合； - The wear resistance and adhesion were measured through nano Indentation and Scratch tester. Microstructures of thin films were characterized by X-ray photoemission spectroscopy ( XPS), X-ray diffraction ( XRD) and auger electron spectroscopy ( AES).
通过X射线光电子能谱（XPS）、X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的结构特征；测试了薄膜与基底的附着力和耐磨性； - Auger electron spectroscopy ( AES) and it's application in superconducting materials analysis
俄歇电子能谱（AES）及其在超导材料分析中的应用 - Microstructures of the CdTe thin films prepared by vacuum evaporation technique were reported by the scanning electron microscope ( SEM), Auger electron spectroscopy ( AES) and x ray diffraction ( XRD).
应用真空蒸发技术制备CdTe薄膜，并借助于扫描电子显微镜（SEM）、扫描俄歇谱仪（AES）和X射线衍射仪（XRD）对其微观结构进行分析。 - Introduce the measuring principle of auger electron spectroscopy apparatus. applying the apparatus to failure analysis is illustrated.
介绍俄歇电子能谱仪的测试原理，举例说明在失效分析中的应用。 - Application of electron spectroscopy, electrochemistry, electron microscope and biological mass spectrometry in the study of substructure, electron tunnel, electrode activity and iron release kinetics of ferritin are described.
介绍了电子光谱、电化学、电子显微镜和生物质谱等分析技术在铁蛋白亚基结构、电子隧道、电极活性和释放铁动力学研究中的应用。 - The surface sputtering of the binary Cu-Ti amorphous alloy systems has been studied using low energy ion scattering spectroscopy ( ISS) and Auger electron spectroscopy ( AES) in this paper.
本文用低能离子散射谱（ISS）和Auger电子谱（AES）研究了二元非晶态Cu-Ti合金系的表面溅射。 - Microanalysis of field emission auger electron spectroscopy
场发射俄歇电子能谱显微分析 - A system of Auger electron spectroscopy ( AES) for surface analysis was presented.
介绍了一台用于表面分析的俄歇电子能谱仪（AES）系统。 - Studies of surface and interface for thin cu_xs-cds heterostructure by Auger electron spectroscopy
薄膜CuXS-CdS异质结构中的表面和界面的AES谱研究 - The component and characteristics of film have been studied by means of Infrared Spectroscopy, Auger Electron Spectroscopy, Ellipsometry and C-V measurement.
利用红外吸收光谱、俄歇电子能谱、椭圆偏振仪及C&V测试等分析方法研究了氮化硅膜的成份和性能。 - Characteristics of TiN_x Film and Analysis by Auger Electron Spectroscopy
TINx薄膜的特性和俄歇电子能谱分析 - Electron Spectroscopy for Chemical Analysis ( ESCA), Fourier Transform-InfraRed Spectroscopy ( FTIR) and Scanning Electron Microscope ( SEM) were used to observe the changes in surface characteristics of papers which were exposed under sunlight or artificial ultraviolet light.
利用化学分析光电子能谱仪（ESCA）、傅里叶转换红外光谱仪（FTIR）和扫描电子显微镜（SEM），研究了纸在阳光暴露或人造紫外光辐射时其表面性质的变化。 - Microstructures of thin films are characterized by X-ray Diffraction ( XRD) and auger Electron spectroscopy ( AES).
通过X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的微结构； - The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
结合俄歇电子能谱和红外光谱分析膜的微观结构，对薄膜的电子注入特性进行了理论分析与讨论。 - In-situ film composition analysis was carried out in the analysis chamber with Auger electron spectroscopy ( AES).
利用在位俄歇电子能谱（AES）分析了薄膜表面的组分。 - Electron microscopy and electron spectroscopy techniques have been important tools for material characterization particularly on quantitative analysis.
电子显微技术以及电子能谱技术已成为材料表征特别是定量分析的重要工具。